SUPER XRF检测仪器EDX1800B是一款功能强大的X荧光光谱仪。它综合了仪器的常规测试(普通模式)和特有的光路系统测试 (超锐模式),普通模式能完成全元素,贵金属,RoHS,镀层等常规测试,超锐模式能对客户比较关心的低含量元素进行更的测试。XRF检测仪器主要是使用天瑞仪器特有超锐光路系统,降低仪器的背景噪音,提高仪器的检出能力,从而提高仪器的整体检测性能。
1.5. 工作条件 Working Condition
● 工作温度:15-30℃ Workingtemperature: 15-30℃
●相对湿度:≤70% Relative humidity:≤70%
● 电 源:AC: 220±5V Power supply:AC 220±5V
1.6. 技术性能及指标: TechnicalPerformance and Specifications
1.6.1. 元素分析范围从硫S到铀U
The elements can beanalyzed from the sulphur (S) to uranium (U)
1.6.2. 元素含量分析范围为1ppm到99.99%
The element content range from 1 ppm to 99.99%can be analyzed.
1.6.3. 测量时间:60-200秒 Measurement time: 60-200s
1.6.4. RoHS指令规定的有害元素(限Cd/Pb/Cr/Hg/Br)其检测限度高达2ppm及有害元素卤素Cl检测限度高达50ppm;
Detecting for hazardous elements(only Cd/Pb/Cr/Hg/Br) restrictedin RoHS directive, the limit can reach 2ppmand Cl, the limit can reach 50ppm.
1.6.5 八大重金属:铅(Pb)、(Hg)、镉(Cd)、(Cr)、砷(AS).,锑(Sb).硒(Se)钡(Ba)
1.6.6.多次测量重复性可达0.1%(总荧光强度)(当样品含量大于96%);
The measurementrepeatability on many occasions can reach 0.1% of total intensity offluorescence when the content of samples is greater than 96%.
1.6.7.长期工作稳定性为0.1%;(总荧光强度)
Long-term workingstability being 0.1% (total intensity of fluorescence)
2.1.1. 电制冷半导体探测器;分辨率:135±5电子伏特 Electro-refrigerationsemiconductor detector; Resolution: 135±5eV
2.1.2. 对样品特征X射线进行探测;把探测采集的信息进一步放大。对样品的检出限、测试精度大大提高。Detecting characteristicX rays of the samples, and amplifying the information from the detection. Thedetection limit is reduced and detection accuracy is increased greatly.